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A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.
Zakup książki
Foundations of Measurement Volume II, Amos Tversky, David H. Krantz, Robert Duncan Luce, Patrick Suppes
- Język
- Rok wydania
- 2006
- Oprawa
- (miękka)
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- Tytuł
- Foundations of Measurement Volume II
- Podtytuł
- Geometrical, Threshold, and Probabilistic Representations
- Język
- angielski
- Wydawca
- Dover Publications
- Rok wydania
- 2006
- Oprawa
- miękka
- Liczba stron
- 512
- ISBN10
- 0486453154
- ISBN13
- 9780486453156
- Kategorie
- Tagi
- Nauka, Technologia
- Ocena
- 3,35 z 5
- Opis
- A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.