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NanoScience and Technology: Atomic Force Microscopy

Second Edition

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The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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NanoScience and Technology: Atomic Force Microscopy, Bert Voigtländer

Język
Rok wydania
2019
Oprawa
(twarda)
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Tytuł
NanoScience and Technology: Atomic Force Microscopy
Podtytuł
Second Edition
Język
angielski
Wydawca
Springer
Rok wydania
2019
Oprawa
twarda
Liczba stron
345
ISBN10
3030136531
ISBN13
9783030136536
Seria
Ocena
5 z 5
Opis
The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.