Parametry
- 689 stron
- 25 godzin czytania
Więcej o książce
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Zakup książki
Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Język
- Rok wydania
- 2003
- Oprawa
- (twarda)
Metody płatności
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- Tytuł
- Scanning Electron Microscopy and X-Ray Microanalysis
- Podtytuł
- Third Edition
- Język
- angielski
- Autorzy
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Wydawca
- Springer
- Rok wydania
- 2003
- Oprawa
- twarda
- Liczba stron
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Seria
- Kategorie
- Opis
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.