Surface and Thin Film Analysis
A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition
Więcej o książce
Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
Zakup książki
Surface and Thin Film Analysis, Henning Bubert, Gernot Friedbacher
- Język
- Rok wydania
- 2011
- Oprawa
- (twarda)
Metody płatności
Nikt jeszcze nie ocenił.
- Tytuł
- Surface and Thin Film Analysis
- Podtytuł
- A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition
- Język
- angielski
- Autorzy
- Henning Bubert, Gernot Friedbacher
- Wydawca
- Wiley-VCH
- Rok wydania
- 2011
- Oprawa
- twarda
- Liczba stron
- 558
- ISBN10
- 3527320474
- ISBN13
- 9783527320479
- Seria
- Tagi
- Nauki przyrodnicze, Poradniki, Technologia, Przewodniki, Bestsellery, Wyposażenie, Aplikacje, Analiza chemiczna
- Opis
- Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.